2030XL PRO™ Microspectrometer-Large Samples

The 2030XL PRO™ microspectrophotometer is designed to  acquire spectra, images, and film thickness measurements of microscopic features of large scale samples.  “XL” stands for “extra large” and these are the types of samples for which this instrument was built.

The 2030XL PRO™ microspectrophotometer allows you to measure UV-visible-NIR range transmission, absorbance, reflectance, emission and photoluminescent microspectra™ of features smaller than a micron across.  Yet, depending upon the instrument configuration, the size of the sample can essentially be unlimited.  Now you can map color variations within pixels of the biggest flat panel displays, measure film thickness of 300 mm wafers with ease or measure the fluorescence of the largest artworks.

Features

  • Microspot analysis of large scale samples
  • Spectral Range: 200 to 2500 nm
  • UV-visible-NIR transmission microspectroscopy
  • UV-visible-NIR transmission imaging
  • UV-visible-NIR reflectance microspectroscopy
  • UV-visible-NIR reflectance imaging
  • UV-visible-NIR fluorescence microspectroscopy
  • UV-visible-NIR fluorescence micro-imaging
  • Raman microspectroscopy
  • UV-visible-NIR photoluminescence microspectroscopy
  • UV-visible-NIR photoluminescence imaging
  • Polarization microspectroscopy in the UV, visible and NIR regions
  • Polarization microscale imaging in the UV, visible and NIR regions
  • Thin film thickness measurements
  • Colorimetry of microscopic samples
  • Manual or fully automated operation
  • Featuring Lightblades™ technology
  • Scorpii™ Advanced Illumination system
  • Integrated TE cooled array detectors available for low noise and long term stability
  • Precision temperature control of samples
  • Calibrated, variable measurement areas even smaller than a micron
  • Superior images both with eyepieces and digital imaging
  • Featured with Lambdafire™ spectroscopy and imaging control and analysis software.
  • Specialized software modules including statistical analysis, spectra mapping, spectral databasing, image analysis and more

 

 

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