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ST500 Profilometer | Fast & Large Areas

 


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ST500 ProfilometerFast & Large Areas
The ST500 Profilometer provides fast large area measurement (without stitching) using a 400 mm X-Y axis travel with a maximum speed up to 200 mm/s. With a 50 mm Z axis the system can be equipped with either an optical pen or line sensor for ultra fast measurement (382,000 points per second). Unlike other technologies, each point is a direct, full depth of field during large area measurement without the need of refocusing. A video zoom camera can also be used to provide automated functions to large area measurement complete on a user friendly desktop platform.
• Larger & Open Desktop Platform • Fast Large Area Measurement • High Sample Clearance • Powerful For Quality Control • Customizable Options
Technique
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The Chromatic Confocal technique uses a white light source (LED) that passes through a series of lenses, called an optical pen, which has a high degree of chromatic aberration. The refractive index of the lenses will vary the focal distance of each wavelength of the white light. In effect, each separate wavelength of the white light will focus at a different distance from the optical pen, creating the measurement range. When a surface of interest is within the measurement range a single wavelength of the white light will be in focus while all others will be out of focus. The white light is then reflected back through the optical pen, then through a pin hole filter that allows only the focused wavelength to pass through to a CCD spectrometer. The CCD will indicate the wavelength in focus, which corresponds to a specific distance for a single point. The physical wavelength measured uses no algorithms providing the highest accuracy independent of form, roughness level, illumination and measurement speed. There is no special levelling procedure required. And while others make claims of resolutions Nanovea provides high accuracy.
• Physical Wavelength Measured + No Algorithms Needed for Results = Higher Accuracy
• Level of accuracy independent of form, roughness level, illumination and measurement speed
• No special levelling procedure required
• Most claim very high resolutions. Nanovea provides high accuracy.

CHROMATIC CONFOCAL MEASUREMENT
Chromatic Confocal by design ensures the highest accuracy of all optical techniques. Specifically when measuring surfaces that are geometrically complex (randomly rough surfaces). Other techniques are subject to many error sources that are simultaneously present and it is not possible to remove or compensate for them or even to estimate their combined influences. The Profilometer offer high accuracy across the widest range of materials and surfaces conditions including tissues, biomaterials, polymers, plastics, metals, composites and ceramics. As an additional measurement signal to the height data, the technique also provides reflection intensity which can be used for highlighting features not seen by height variations.  It can also be used to quantitatively measure variation of surface reflectivity.