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Nanovea 3D Non-Contact Profilometers are designed with leading edge optical pens using superior white light axial chromatism. Nano through macro range is obtained during measurement (profile, dimension, roughness, finish, texture, shape, form, topography, flatness, warpage, volume, area, step-height, depth, thickness & others) on a wider range of geometries and materials than any other Profilometer. With the selection of a large range of optical pens users can precisely measure an endless range of applications. Nanovea optical pens have zero influence from sample reflectivity, have advanced ability to measure high surface angles and no sample no preparation is required. Easily measure any material whether transparent, opaque, specular, diffusive, polished, rough etc. Unlike other optical measurement techniques, large surface areas can be precisely measured without any imaging stitching.