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HS2000

 

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HS2000 ProfilometerHigh Speed Inspection & Precision Flatness Measurement
The HS2000 with its granite base and air bearing stages provides superior stability at high speeds for flatness measurement. Specifications for flatness are the best in the industry with less than 1micron over the entire measurement area. The HS2000 provides automated inspection for quality control applications where speed (1m/s) and large areas or multiple measurements are critical. It comes with an enclosure and workstation to create a fully contained stand-alone instrument. The HS2000 equipped with a line sensor can inspect at speed of up to 200 times faster. Designed for high speeds, large area’s and flatness but also excellent for roughness measurements, combined with advanced automation features.
• High Speed • Precision Flatness Measurement • Advanced Automation • User Friendly Technology • Rigid and Stable Structure • Customizable Options

 

 

 

Technique
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The Chromatic Confocal technique uses a white light source (LED) that passes through a series of lenses, called an optical pen, which has a high degree of chromatic aberration. The refractive index of the lenses will vary the focal distance of each wavelength of the white light. In effect, each separate wavelength of the white light will focus at a different distance from the optical pen, creating the measurement range. When a surface of interest is within the measurement range a single wavelength of the white light will be in focus while all others will be out of focus. The white light is then reflected back through the optical pen, then through a pin hole filter that allows only the focused wavelength to pass through to a CCD spectrometer. The CCD will indicate the wavelength in focus, which corresponds to a specific distance for a single point. The physical wavelength measured uses no algorithms providing the highest accuracy independent of form, roughness level, illumination and measurement speed. There is no special levelling procedure required. And while others make claims of resolutions Nanovea provides high accuracy.
• Physical Wavelength Measured + No Algorithms Needed for Results = Higher Accuracy
• Level of accuracy independent of form, roughness level, illumination and measurement speed
• No special levelling procedure required
• Most claim very high resolutions. Nanovea provides high accuracy.

CHROMATIC CONFOCAL MEASUREMENT
Chromatic Confocal by design ensures the highest accuracy of all optical techniques. Specifically when measuring surfaces that are geometrically complex (randomly rough surfaces). Other techniques are subject to many error sources that are simultaneously present and it is not possible to remove or compensate for them or even to estimate their combined influences. The Profilometer offer high accuracy across the widest range of materials and surfaces conditions including tissues, biomaterials, polymers, plastics, metals, composites and ceramics. As an additional measurement signal to the height data, the technique also provides reflection intensity which can be used for highlighting features not seen by height variations.  It can also be used to quantitatively measure variation of surface reflectivity.